Dr. Sonal Singhal | Department of Electrical Engineering

Profile

Dr. Sonal Singhal
Dr. Sonal
Singhal
Associate Professor
Department of Electrical Engineering
School of Engineering (SoE)
C124F
Block-C-Wing, Shiv Nadar University
Greater Noida Uttar Pradesh
India
91-0120-7170100
Extn: 
114
Profile Summary 

Sonal Singhal obtained her Ph.D. from the Indian Institute of Technology Roorkee in 2011 during which she also availed Commonwealth Scholarship (Jan 2010 to Jan 2011) as a split-site scholar at Energy & Sustainable Research Division, University of Nottingham, UK. Currently, she is working at Shiv Nadar University as an Associate Professor in the Department of Electrical Engineering. She has been working in the area of Digital/Analog CMOS VLSI Design. Her research interests include topics like circuit reliability in advanced CMOS technology, Neuromorphic Computing, In-Memory Computing techniques, FPGA based digital design. She is also a recipient of an externally funded project under the Fast-Track Young Scientist Scheme, DST, India (2012) on the fabrication of photovoltaic (PV) devices.

Educational Qualifications 
2012
Ph.D.
IIT Roorkee
2006
M. Tech
IIT Roorkee
Work Experience 
07/19Present
Associate Professor,
Shiv Nadar University,
Greater Noida
I currently work here
20122019
Assistant Professor,
Shiv Nadar University,
Greater Noida
20112012
Assistant Professor,
University of Petroleum and Energy Studies,
Dehradun
Teaching & Research Interests: 

Taught the following courses:

  • Introduction to Electrical Engineering
  • Digital Electronics
  • Analog Electronics 
  • Introduction to Semiconductor
  • VLSI design technology
  • Analog CMOS VLSI design 
  • Embedded System and Hardware
  • Digital design with FPGA
  • Basics of Python and PERL Scripting Language

Some of the research topics that have piqued my interest:

  • Designing of CMOS VLSI Circuits
  • Design of Neuromorphic system with emerging technologies
  • Design and Analyze the Reliability-Aware CMOS VLSI Circuits
  • Implementation of Digital Design on FPGA
  • Embedded Systems for IoT 
  • Design of In-Memory Computing Techniques
  • Reliability-Aware Design of Advanced Computing Techniques

SKILLS

  • EDA Tools: Cadence Virtuoso Platform, Cadence RelXpert, H-SPICE, LT-SPICE, Sentaurus TCAD, Xilinx Vivado Design Suite
  • Hardware: STM32 µ-controller, Arduino, 8051 µ-controller, FPGA board
  • Programming & Hardware Language: Verilog HDL, C, C++, PYTHON
Conferences (Select): 

1. Jani Babu Shaik, S. M. Picardo, S. Singhal, and N. Goel, “Impact of Reliability Issues and Process Variability in Neuromorphic Circuits”, in IEEE Region 10 Symposium (TenSymp), 2022

2. S. B. Jani, S.P. Chaudhari, S. Singhal, and N. Goel, “Analyzing Impact of NBTI and Time-Zero Variability on Dynamic SRAM Metrics”, 2018 INDICON, Coimbatore, 2018

3. S. P. Chaudhari, S. B. Jani, S. Singhal, and N. Goel, “Correlation of Dynamic and Static Metrics of SRAM Cell under Time-Zero Variability and after NBTI Degradation”, IEEE iSES, Hyderabad, 2018

Awards(Selected): 
20102011

Commonwealth Scholarship as a split-site scholar at Energy & Sustainable Research Division, University of Nottingham, UK.

20142017

Young Scientist Award by DST

2017

Cadence All India Design Contest Runner Up Award, Cadence Design Systems

 

2018

Awarded best oral presentation and travel grant in iSES-2018 conference, Hyderabad, India 

 

Scholarly Activity

Journal Publications (accepted or published)

2022

A. VS, J. B. Shaik, S. Singhal, S. M. Picardo, and N. Goel, “Design and Mathematical Modelling of Inter Spike Interval of Temporal Neuromorphic Encoder for Image Recognition,” [Online]. Available: http://arxiv.org/abs/2205.09519.

2022

J. B. Shaik, S. Singhal, S. M. Picardo, and N. Goel, “Impact of various NBTI distributions on SRAM performance for FinFET technology,” Integration, vol. 83, pp. 60–66, Mar. 2022.

2022

Jani Babu Shaik, Aaditya VS, S. Singhal, N. Goel, “Reliability-Aware Design of Temporal Neuromorphic Encoder for Image Recognition”, Int. J. Circuit Theory and Applications. vol. 50(4), pp. 1130-1142, 2022.

2021

S. M. Picardo, Jani Babu Shaik, N. Goel, and S. Singhal, “Integral impact of PVT variation with NBTI degradation on dynamic and static SRAM performance metrics,” Int. J. Electron., vol 109(2) pp. 293-316, Apr. 2021,

2017

Jyotirmoy Dutta, Atul Vir Singh, Sonal Singhal, Madhur Deo Upadhayay “A comparative study on the design and simulation of TFBAR and polyimide TFBAR based RF bandpass filters” Microsystem Technologies, vol 23(12) pp 5789-5795, 2017.

2020

Jani Babu Shaik, S. Singhal, and N. Goel, “Analysis of SRAM metrics for data-dependent BTI degradation and process variability,” Integration, vol. 72, pp.148–162, May 2020.

2022

R. Singh, A. K. Singh, and S. Singhal, “Physics experiments using Arduino: determination of the air quality index,” Phys. Educ., vol. 57, no. 2, p. 025013, Mar. 2022.

Books & Book Chapters

"Four-Stage Telecommunication Switching Design and Synthesis Adesh Kumar, Piyush Kuchhal and Sonal Singhal” Springer Science+Business Media Singapore September, 2017, PP 1079-1085

Conference Publications

Sonal Singhal, Shrey Jain, Nthin B, Bhawna Rawat and Hari Om Gupta, “Performance Evaluation of Uttarakhand Electric Utility using Slack Based Measure and Two-Stage DEA Modelling”, communicated (in May  2016) to IEEE International Conference On Electrica

Jani Babu Shaik, R. Singh, S. M. Picardo, N. Goel, and S. Singhal, “Investigating the impact of BTI, HCI and time-zero variability on neuromorphic spike event generation circuits” International Workshop on Physics and Semiconductor Devices (IWPSD), Kolkata, 2019, 

2022

S. M. Picardo, Shaik Jani Babu, S. Singhal, N.Goel, “Device Reliability Affecting Coding Schemes in Neuromorphic Circuits”, in IEEE Region 10 Symposium (TenSymp), IIT Bombay, Mumbai 2022.

2022

Jani Babu Shaik, S. M. Picardo, S. Singhal, and N. Goel, “Impact of Reliability Issues and Process Variability in Neuromorphic Circuits”, in IEEE Region 10 Symposium (TenSymp), IIT Bombay, Mumbai, 2022.

Journal Publications (submitted)

2022

Jani Babu Shaik, S. M. Picardo, S. Singhal, and N. Goel, “Reliability-Aware Design of Integrate-and-Fire Silicon Neurons,” IEEE Trans. on Computer-Aided Design of Integrated Circuits and Systems