Jani Babu Shaik | Department of Electrical Engineering


Jani Babu
Ph.D. Research Scholar
Department of Electrical Engineering
School of Engineering (SoE)
Ph.D. Research Scholar
Block-Academic Bolck-C, Shiv Nadar University
Greater Noida Uttar Pradesh
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Profile Summary 

Shaik Jani Babu earned a bachelor's degree in technology from Vasireddi Venkatadri Institute of Technology in 2013 and a master's degree in technology from the National Institute of Technology, Hamirpur, in 2016. In January 2017, he joined Shiv Nadar university for pursuing Ph.D. degree in VLSI design, where he worked for five years in brain-inspired circuits and computing. He also worked in research domains such as FPGA based digital design, emerging memory devices, in-memory computing, CMOS circuit reliability and so on. Currently, he published four peer-reviewed SCI journals and nine conferences publication in scopus indexed. He has attended several workshops/internships during his academic carrier. He is IEEE student member. 

Educational Qualifications 
Shiv Nadar University
M. Tech
National Institute of Technology (NIT), Hamirpur
Vasireddi Venkatadri Institute of Technology (VVIT), Guntur
Work Experience 
Teaching Assistant,
National Institute of Technology (NIT), Hamirpur,
Graduate Teaching Assistant,
Shiv Nadar University (SNU),
Greater Noida
Research Associate,
Shiv Nadar University,
Grater Noida
Teaching & Research Interests: 

Assisted for the following courses:

The following are some of the research topics that have piqued my interest:

  • Designing of CMOS VLSI Circuits
  • Design of Neuromorphic system with emerging technoogies (RRAM, spintronics etc.)
  • Design and Analyze the Reliability-Aware CMOS VLSI Circuits
  • Design of Semiconductor Device using Technology CAD tool
  • Implementation of Spiking Neural Networks (SNN) using python
  • Implementation of Artificial Neural Networks on FPGA
  • Computer Hardware architecture
  • Embedded Systems for IoT 
  • Machine Learning tasks using python


  • Participated in Short Course in Modeling and Simulation of Nano Transistors (Mar 2021), Organized by NanoLab @ IIT Kanpur
  • Participated in Tutorial Session in Neuromorphic Devices (Nov 2020), Organized by IIT Delhi
  • Completed an internship in Physical Design and Verification Internship Program (Aug 2020 - Oct 2020), Organized by Entuple Technologies Pvt. Ltd.
  • Participated in few faculty development programs, workshops and invite talk sessions held at Shiv Nadar University
  • Participated in INUP workshop held at NIT hamirpur


  • EDA Tools: Cadence Virtuoso Platform, Cadence RelXpert, Cadence Layout Editor, H-SPICE, LT-SPICE, Sentaurus TCAD, Cadence Tempus, Cadence Innovus, Cadence Genus, Xilinx Vivado Design Suite
  • Hardware: STM32 µ-controller, Arduino, 8051 µ-controller, FPGA boards (ZYBO & NEXYS 4)
  • Programming & Hardware Language: MATLAB, HDL (Verilog/System Verilog), C, C++, PYTHON, Verilog-A
  • Other Skills: Machine Learning, Spiking Neural Network, NeuroSim simulator, Origin Software, MS Office, Latex, Operating Systems (Windows and Linux), Matlab HDL Coder



Earned STAR certificate during Physical Design and Verification Internship Program


Best Oral presentation and Received Travel Grant at iSES 2018, Hyderabad Conference

Scholarly Activity

Conference Publications


S. P. Chaudhari, J. B. Shaik, S. Singhal and N. Goel, "Correlation of Dynamic and Static Metrics of SRAM Cell under Time-Zero Variability and After NBTI Degradation," 2018 IEEE International Symposium on Smart Electronic Systems (iSES) (Formerly iNiS), 2018, pp. 90-93.


S. J. Babu, S. P. Chaudhari, S. Singhal and N. Goel, "Analyzing Impact of NBTI and Time-Zero Variability on Dynamic SRAM Metrics," 2018 15th IEEE India Council International Conference (INDICON), 2018, pp. 1-5..


Gill P.K., Babu S.J., Singhal S., Goel N. "FPGA Implementation of Random Feature Mapping in ELM Algorithm for Binary Classification", in Modelling, Simulation and Intelligent Computing - MoSICom 2020. Lecture Notes in Electrical Engineering, vol 659. Springer, Singapore


S. M. Picardo, J. B. Shaik, S. Sahni, N. Goel, and S. Singhal,  "Analyzing the Impact of NBTI and Process Variability on Dynamic SRAM Metrics Under Temperature Variations", in Modelling, Simulation and Intelligent Computing, N. Goel, S. Hasan, and V. Kalaichelvi, Eds. Dubai, 2020, pp. 608–616.


S. J. Babu et al., "Investigating the Impact of BTI and HCI on Log-Domain Based Mihalas–Niebur Neuron Circuit", in Modelling, Simulation and Intelligent Computing, N. Goel, S. Hasan, and V. Kalaichelvi, Eds. Dubai, 2020, pp. 528–536.


Aadhitiya VS, Jani Babu Shaik, S. Singhal, S. M. Picardo, N. Goel, "Design and Mathematical Modelling of Inter Spike Interval of Temporal Neuromorphic Encoder for Image Recognition", in 5th International Conference on Emerging Electronics (ICEE)

Journal Articles


Jani Babu Shaik, Sonal Singhal, Nilesh Goel, "Analysis of SRAM metrics for data dependent BTI degradation and process variability", Integration, Vol (72), 2020, Pages 148-162


S.M. Picardo, Jani Babu Shaik, N. Goel, S. Singhal, "Integral Impact of PVT variation with NBTI degradation on SRAM dynamic and static performance metric" in International Journal of Electronics


Jani Babu Shaik, S. Singhal, S. M. Picardo, and N. Goel, “Impact of various NBTI distributions on SRAM performance for FinFET technology”, Integration the VLSI Journal, vol(83), 60-66, 2021


Jani Babu Shaik, Aaditiya VS, S. Singhal, N. Goel “Reliability-aware design of Neuromorphic Temporal Encoder for Image Recognition”, International Journal of Circuit Theory and Applications vol. 50(4), pp. 1130-1142, 2021

Journal Publications (submitted)


Jani Babu Shaik, S. M. Picardo, S. Singhal, and N. Goel, “Reliability-Aware Design of Integrate-and-Fire Silicon Neurons”, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems


Jani Babu Shaik, S. Singhal, N. Goel, “Design and Analysis of Energy-Efficient and Reliability-Aware Neuromorphic System” Microelectronics Journal


S. M. Picardo, Jani Babu Shaik, S. Singhal, N. Goel, “Enabling Efficient Rate and Temporal Coding using Reliability-Aware Design of a Neuromorphic Circuit”, International Journal of Circuit Theory and Applications



Shaik Jani Babu, R. Singh, S. M. Picardo, N. Goel, and S. Singhal, "Investigating the impact of BTI, HCI and time-zero variability on neuromorphic spike event generation circuits", IWPSD 2019